A Study on the Bromine-induced Corrosion/Defects in Wafer Fabrication by Hua Younan* , Liao Jinzhi Lois, Zhu Lei, Liu Binghai, Li Xiaomin WinTech Nano-Technology Services Pte. Ltd.,10 Science Park Road, #03-26, The Alpha Science Park II, 117684, Singapore * Author to whom correspondence should be addressed. Journal of Engineering Research and Sciences, Volume 3, Issue …
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Failure Analysis & Mechanism Studies of the Worm-like Defects in Vias of Wafer Fabrication by Hua Younan* , Liao Jinzhi Lois, Liu Binghai, Zhu Lei, Li Xiaomin WinTech Nano-Technology Services Pte. Ltd.,10 Science Park Road, #03-26, The Alpha Science Park II, Singapore 117684 * Author to whom correspondence should be addressed. Journal of Engineering Research …
Volume 3, Issue 2 Download Complete Issue This edition presents a multidisciplinary collection exploring diverse domains. One paper elucidates how Building Information Modeling facilitates environmentally sustainable design in architecture and construction, enabling energy simulations and green certification compliance, though interoperability challenges persist. In semiconductor manufacturing, a study unravels the mechanisms of bromine-induced aluminum corrosion, filling …
Volume 2, Issue 12 Download Complete Issue ABC Editorial Front Cover Publication Month: January 2022, Page(s): A1 – A1 Editorial Board Publication Month: January 2022, Page(s): B1 – B1 Editorial Publication Month: January 2022, Page(s): C1 – C1 Table of Contents Publication Month: January 2022, Page(s): D1 – D1 Articles Failure Analysis & Mechanism Studies …
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