A Study on the Bromine-induced Corrosion/Defects in Wafer Fabrication

A Study on the Bromine-induced Corrosion/Defects in Wafer Fabrication by Hua Younan* , Liao Jinzhi Lois, Zhu Lei, Liu Binghai, Li Xiaomin WinTech Nano-Technology Services Pte. Ltd.,10 Science Park Road, #03-26, The Alpha Science Park II, 117684, Singapore * Author to whom correspondence should be addressed. Journal of Engineering Research and Sciences, Volume 3, Issue …

Failure Analysis & Mechanism Studies of the Worm-like Defects in Vias of Wafer Fabrication

Failure Analysis & Mechanism Studies of the Worm-like Defects in Vias of Wafer Fabrication by Hua Younan* , Liao Jinzhi Lois, Liu Binghai, Zhu Lei, Li Xiaomin  WinTech Nano-Technology Services Pte. Ltd.,10 Science Park Road, #03-26, The Alpha Science Park II, Singapore 117684 * Author to whom correspondence should be addressed. Journal of Engineering Research …

Volume 2, Issue 12

Volume 2, Issue 12 Download Complete Issue ABC Editorial Front Cover Publication Month: January 2022, Page(s): A1 – A1  Editorial Board Publication Month: January 2022, Page(s): B1 – B1 Editorial Publication Month: January 2022, Page(s): C1 – C1 Table of Contents Publication Month: January 2022, Page(s): D1 – D1 Articles Failure Analysis & Mechanism Studies …